纳米颗粒鉴定

特色产品

NexION^® 350 ICP-MS

Get more out of your ICP-MS for maximum throughput, minimum downtime for optimum insight for trace level metals analysis.

LAMBDA™ 1050 UV/VIS

Enhanced performance for the highest sensitivity and resolution, ideal for the measurement of optical materials, including high performance glass and coatings.

AxION DSA^™(Direct Sample Analysis) System

From sample to results in seconds. No up-front separation, method development, or sample preparation is needed.

识别单个纳米颗粒的关键特性，例如大小和结构，这对于确定其可能对环境产生的影响或寻找产品创新的新机会非常重要。

我们专有的技术和专业知识让科学家可鉴定纳米物质至此程度，并可改进和提高更具说服力的开发。